India is one of the major producers of wheat and occupies second place after china in terms of area and production among wheat growing countries of the world. Wheat production is constrained by a number of biotic and abiotic stresses. Spot blotch (Bipolaris sorokinana) is an important foliar disease of wheat in South-East Asia. This is a destructive disease of wheat in warm and humid wheat growing regions of the world. Due to change in climate the incidence of leaf blight (spot blotch) is of increasing concern now in north western plains zone, which is considered to be wheat bowl of India. Two hundred elite accessions of CIMMYT along with suitable checks were evaluated in three crop seasons during 2013-16 and data were recorded for spot blotch severity and important morpho-agronomic traits at G.B. Pant University of Agriculture& Technology, Pantnagar, India under augmented block design. GxE interaction was analysed using AMMI model. Accessions were analyzed for genetic diversity and they were grouped into 8 clusters by Non-hierarchical Euclidean cluster analysis. The statistical analysis revealed that variance was found highest for AUDPC value followed by grain yield and lowest for days to maturity. The mean sum of squares due to genotypes, environments and G × E interaction were highly significant for most of the characters. The G × E interaction was significant for various traits and it was further partitioned into three interaction PCA (IPCA) axes but only first two significant interactions (IPCA1 and IPCA2) were taken into account for the preparation of AMMI biplot graphs. Spot blotch severity has significant and negative correlation with grain yield, thousand grain weight, plant height, days to 75% heading and days to maturity. The accessions showing stability for important traits across the year based on AMMI biplot analysis could be used in breeding programme for trait improvement.