Race-specific stripe rust resistance genes (Yr genes) have been deployed into wheat cultivars against stripe rust caused by Puccinia striiformis f. sp. tritici Eriks. (Pst); however, the resistance has been quickly broken down only years after its introduction. Some studies with several different pathosystems indicate that some defeated disease resistance genes show partial non-race-specific resistance, known as residual effect, to the virulent pathogen races and could be pyramided into a cultivar to acquire effective disease resistance. No study has been conducted on this subject in stripe rust resistance genes (Yr) of wheat to date. Near isogenic lines (NILs) with defeated Yr genes were used in this study to evaluate the residual effect of those genes as possible durable resistance. The parental NILs with single Yr genes (Yr10, Yr26, Yr32) with ‘Avocet’ background, F5 NILs with two Yr genes in the combinations of Yr26/Yr10, Yr32/Yr10 and Yr32/Yr26 and susceptible cultivar ‘Avocet’ were inoculated with one of three Pst inoculums (W020, W049, T034+W052) virulent to all three Yr genes and infection type (IT), infection area (IA) and latent period (LP) were recorded. The same NILs were tested in stripe rust nurseries at Saskatoon, SK and Lethbridge, AB in 2018 and disease incidence and severity were recorded. With the growth chamber experiment, the range of IT tended to be lower in all NILs with Yr32/Yr10 and Yr32/Yr26 genes with T034+W052. With other isolates, IA was reduced and LP was extended more often in the NILs with Yr32/Yr10 and Yr32/Yr26 genes than with Yr26/Yr10. The extension of LP correlated with reduction of IA and IT. With field disease nurseries, the natural Pst population appeared to be avirulent to Yr10 and Yr26 at both locations and the results were inconclusive. The results from growth chamber experiments suggest that residual effect by defeated Yr genes possibly exists in certain combinations and further study is required for better understanding of the mechanism.