The English grain aphid, Sitobion avenae (F.), is a destructive pest in common wheat (Triticum aestivum L.), and it appears in wheat production regions of China and other areas worldwide. Breeding resistant varieties is considered the most effective, economical and environmentally friendly approach to control aphid. This study aimed to identify quantitative trait loci (QTL) for aphid resistance in 164 F6 recombinant inbred lines (RILs) from the ‘Avocet’בChilero’ cross. Here, we employed DArT marker approach to generate a high-density genetic map. The map spanned 8202.2 cM, containing 3627 markers on 21 chromosomes, with a mean marker distance of 2.3 cM between adjacent markers. We identified a major QTL for aphid resistance on chromosome 2B. QSa.haust-2B was mapped to 2 cM interval between markers DArT4991074 and DArT1216791, explaining 11.78%-16.93% of the phenotypic variance. The physical interval was 67.5-68.2 Mb containing 6 genes. Combining annotation information of the IWGSC RefSeq, TraesCS2B02G106400, TraesCS2B02G106500 and TraesCS2B02G106600 were Sex determination protein, TraesCS2B02G106700 and TraesCS2B02G106800 were Wound-induced protein WI12, TraesCS2B02G106900 was finally identified as the potential candidate gene, which encoded resistance protein containing LRR domain. Above all, a new QTL for wheat resistance to S.avenae was located on chromosome 2B, which provided theoretical support for fine mapping and cloning of genes in the later stage.