Stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most damaging diseases of wheat worldwide, especially in the United States. The disease is primarily controlled by developing and growing resistant cultivars and applying fungicides when needed. To control the disease on a yearly basis, potential yield losses are predicted based on weather data using models developed in our program before stripe rust development, field surveys are conducted during the crop season, recommendations are made for implementing appropriate control measures for individual cultivars based on the yield loss prediction, field surveys, and cultivar resistance level. For improving control of stripe rust, various studies have been conducted for new knowledges of virulence, genomics, and population genetics of the pathogen, epidemiology of the disease, host resistance, and measures for integrated control. Races of the pathogen have been identified using a set of Yr single-gene differentials, and selected races are used in greenhouse tests, together with field tests, to screen wheat germplasm and breeding lines for developing new resistant cultivars. Simple sequence repeat (SSR), single-nucleotide polymorphism (SNP), and Kompetitive allele specific PCR (KASP) markers have been developed for monitoring the pathogen population changes. To discover more genes for resistance to stripe rust, bi-parental populations and assembled panels of wheat germplasm have been studied using QTL mapping and genome-wide association study (GWAS) approaches, respectively, for identifying a large number of resistance genes or QTL including numerous new genes. KASP markers have been developed for new resistance loci and new wheat germplasm lines have been developed for new resistance genes and combinations of genes on same chromosomes for more efficiently use in breeding programs. As a necessary component, new fungicides with high efficacies have been identified to diversify chemicals used in control of stripe rust.