Email: neeraj35669@gmail.com; neeraj.budhlakoti@icar.gov.in

Powdery mildew (PM), caused by Blumeria graminis f. sp. tritici, presents a significant challenge to wheat farming, emphasizing the urgency of developing genetically resistant wheat varieties for sustainable management. Consequently, investigating the genetic makeup of PM in wheat to identify crucial genomic regions is a vital aspect of wheat research. In recent times, meta-QTL (MQTL) analysis has emerged as a key method for deciphering the intricate genetic architecture governing complex quantitative traits.

This study aimed to conduct a QTL meta-analysis to pinpoint specific genomic regions in wheat associated with PM resistance. By integrating data from 222 QTLs across 33 linkage-based studies using a consensus map featuring 54,672 markers, the analysis revealed 39 MQTLs, which were further refined to 9 high-confidence MQTLs (hcMQTLs) with confidence intervals ranging from 0.49 to 12.94 cM. The MQTLs spanned an average physical interval of 41.00 Mb, varying from 0.000048 Mb to 380.71 Mb per MQTL. Notably, 18 MQTLs were found to co-localize with known resistance genes such as Pm2, Pm3, Pm8, Pm21, Pm38, and Pm41.

The study identified 256 gene models within hcMQTLs, offering potential targets for marker-assisted breeding and genomic prediction programs aimed at enhancing PM resistance. These MQTLs provide a basis for fine mapping, gene isolation, and functional genomics studies, facilitating a deeper comprehension of molecular mechanisms.

The discovery of candidate genes presents exciting prospects for validating and ultimately developing PM-resistant wheat varieties.